A STEM shoots an electron beam through a thin-film sample and scans the beam across the sample in subatomic steps. In addition to forming an image, the new microscope can identify atoms in its path by a process called electron energy-loss spectrometry. Atoms in the path of the beam absorb energy from some of its electrons to kick their own electrons into higher orbits. The amount of energy this takes is different for each kind of atom.
The detector that collects electrons emerging from the sample measures the energy losses, and from this the atoms in the path of the beam can be identified. The detector can simultaneously produce multiple images -- one for every different species of atom in the sample, and these can be color-coded, each color representing a different electron energy signature.
The method also can show how atoms are bonded to one another in a crystal, because the bonding creates small shifts in the energy signatures. In earlier STEMS, many electrons from the beam, including those with changed energies, were scattered at wide angles by simple collisions with atoms. The new STEM includes magnetic lenses that collect emerging electrons over a wider angle. Previously, Silcox said, about 8 percent of the emerging electrons were collected, but the new detector collects about 80 percent, allowing more accurate readings of the small changes in energy levels that reveal bonding between atoms.
More complete collection and a brighter and a more sharply focused beam also allow the new microscope to scan much faster. In early tests it collected a 4,096-pixel image in about 30 seconds, 50 to 100 times faster than in conventional STEMs.
To demonstrate the capability of the new instrument, Muller examined a sample consisting of layers of two different mater
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