| HOME >> BIOLOGY >> TECHNOLOGY |
Physicists at the National Institute of Standards and Technology (NIST) have demonstrated a new ion trap that enables ions to go through an intersection while keeping their cool. Ten million times cooler than in prior similar trips, in fact. The demonstration, described in a forthcoming paper in Physical Review Letters,* is a step toward scaling up trap technology to build a large-scale quantum computer using ions (electrically charged atoms), a potentially powerful machine that could perform certain calculationssuch as breaking todays best data encryption codesmuch faster than todays computers.
NISTs new trap with a junction solves a key engineering issue for future possible ion-trap quantum computers: how to move ions in a particular quantum mechanical state back and forth between different locations for data storage or logic operations, without heating them up so much that they lose their fragile quantum properties, which are critical to information processing.
The new ion trap, a rectangle roughly 5 by 2 millimeters in outer dimensions, was constructed from laser-machined alumina, with a gold coating to form electrodes. It is more complex than previous NIST ion traps, with 46 electrodes supporting 18 ion trapping zones. Its unique feature is an X-shaped bridge connecting electrodes across a junction between zones. Junctions are required to allow ions to be grouped together efficiently for logic operations. As voltages are applied to different electrodes to move the ions, the electric fields restrain an ion as it moves between trapping zones. The fields created by the X-bridge are required for smooth transport through the junction and to keep ions from popping out at the junction.
NIST scientists transported single beryllium ions through the X-junction more than 1 million times while maintaining the properties critical to information processing with greater than 99.99 percent success. Pairs of ions were transported over 100
'/>"/>
| Contact: Laura Ost laura.ost@nist.gov 303-497-4880 National Institute of Standards and Technology (NIST) Source:Eurekalert |