"Our findings hold the first indications of a small position-dependent interaction between the layers," said David L. Miller, the paper's first author and a graduate student in First's laboratory. "This interaction occurs only when the size of a cyclotron orbit which shrinks as the magnetic field is increased becomes smaller than the size of the observed patches."
The origin of the position dependent interaction is believed to be the "moir pattern" of atomic alignments between two adjacent layers of graphene. In some regions, atoms of one layer lie atop atoms of the layer below, while in other regions, none of the atoms align with the atoms in the layer below. In still other regions, half of the atoms have neighbors in the underlayer, an instance in which the symmetry of the carbon atoms is broken and the Landau level discrete energy level of the electrons splits into two different energies.
Experimentally, the researchers examined a sample of epitaxial graphene grown at Georgia Tech in the laboratory of Professor Walt de Heer, using techniques developed by his research team over the past several years.
They used the tip of a custom-built scanning-tunneling microscope (STM) to probe the atomic-scale electronic structure of the graphene in a technique known as scanning tunneling spectroscopy. The tip was moved across the surface of a 100-square nanometer section of graphene, and spectroscopic data was acquired every 0.4 nanometers.
The measurements were done at 4.3 degrees Kelvin to take advantage of the fact that energy resolution is proportional to the temperature. The scanning-tunneling microscope, designed and built by Joseph Stroscio at NIST's Center for Nanoscale Science and Technology, used a superconducting magnet to provide the magnetic fields needed to study the orbits.
According to First, the study raises a number of questions for future research, including how the energy gaps will affect electron t
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Georgia Institute of Technology Research News