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Using highly uniform samples of carbon nanotubessorted by centrifuge for lengthmaterials scientists at the National Institute of Standards and Technology (NIST) have made some of the most precise measurements yet of the concentrations at which delicate mats of nanotubes become transparent, conducting sheets. Their recent experiments* point up the importance of using relatively homogeneousnot overly short, but uniform in length nanotubes for making high performance conducting films.
Among their other qualities, single-wall carbon nanotubes (SWCNTs) have attracted much attention as tiny electrical conductors. Relatively small concentrations of nanotubes can change a normally insulating polymer film to a transparent electrical conductor. Potential applications range from transparent electrical shielding materials to futuristic flexible video displays, thin-film chemical sensors and other foldable electronics. One key design parameter for conductive films is the so-called percolation thresholdessentially the concentration at which random two- or three-dimensional networks of nanotubes first become electrically conducting.
To test theories on how both the conductance and optical properties of such nanotube-infused films depend on the length of the tubes, the NIST team made samples of buckypaper by mixing nanotubes in water and draining the water away through nanoscale filters to leave behind a delicate nanotube mat. The highly refined, length-sorted nanotube samples were produced by an efficient technique developed earlier by the NIST group (see Spin Control: New Technique Sorts Nanotubes by Length).
The NIST measurements validated one theory: buckypaper made of length-sorted carbon nanotubes closely follows the percolation theory for ideal two-dimensional sheets, with concentration threshold for conductivity getting lower as the tubes get longer. A sheet of 820 nanometer long nanotubes becomes conducting at an amazingly low 18 nanog
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| Contact: Michael Baum michael.baum@nist.gov 301-975-2763 National Institute of Standards and Technology (NIST) Source:Eurekalert |