Latest Update Offers Unifying Platform for Fully-Integrated Microscopy
MELVILLE, N.Y., Nov. 29 /PRNewswire/ -- Nikon Instruments, Inc. (http://www.nikoninstruments.com) today announced the launch of the latest version of its industry-leading microscopy acquisition and analysis software -- NIS-Elements. When paired with Nikon's new Eclipse Ti inverted microscope series, NIS-Elements' latest version enables exceptional image data throughput and multi-dimensional image capture routines that advance productivity and minimize photobleaching and cell phototoxicity. The fully-integrated system, which is ideal for high-end research and live-cell imaging, enables extremely fast image sequence control and acquisition through faster motorized components that are intelligently managed in parallel through the NIS-Elements software.
All aspects of the Ti microscope system are seamlessly combined through the software, pulling the advanced functionality and extremely fast device speed of the Ti together with innovative acquisition controls and image analysis power, which are tightly integrated to further improve the Ti's high-speed imaging capabilities. This allows diverse image acquisition and analysis methods with techniques such as FRET, FRAP, Colocalization, 2-D Object Tracking, Ratio analysis with integrated calcium calibrations, Kymograph displays and photo-activation routines.
"The advancements with the latest version of NIS-Elements deliver a level of microscope system integration previously unheard of in the industry," said Stan Schwartz, vice president, Nikon Instruments, Inc. "Our goal is to further position NIS-Elements software as the industry's premier platform for microscopy imaging analysis solutions."
Built to enhance speed and simplify the imaging and data gathering
process, NIS-Elements offers the most flexible experimental des
|SOURCE Nikon Instruments, Inc.|
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