Unique Technology Greatly Improves Signal to Noise
MELVILLE, N.Y., Dec. 15 /PRNewswire/ --Nikon Instruments, Inc. (www.nikoninstruments.com) today launched VAAS Detection, a new, exclusive confocal imaging method for post acquisition recovery of data normally lost during the course of the experiment. This is accomplished by collecting emission photons that normally are rejected by the emission side pinhole, traditionally used at the 1 airy disk size. This unique technology allows for virtual adjusting of the confocality and sensitivity of data post-acquisition, as well as collecting more photons during the initial image acquisition to enable image reconstruction with greatly improved signal-to-noise.
VAAS, which stands for Virtual Adjustable Aperture System, uses two pinholes to collect emitted photons: a standard-sized one to enable confocality and one with a diameter three-times larger to capture more of the emitted fluorescence without increasing the out of focus background detection. VAAS is an effective method to reduce the out of focus haze signal without reducing the signal from the focal plane.
In using a traditional confocal microscope, images are acquired after adjusting and fixing the diameter of the emission pinhole aperture according to the specimen and instrument conditions. Any emission falling outside of the pinhole is lost. Nikon's VAAS Detection addresses this limitation by collecting photons originating from the selected plane of focus as well as from adjacent planes in a single scan, and independently collecting the signals into independent channels. After the experiment, data can be added back, or the original data can be further deconvolved using this extra collected information.
"The VAAS Detection system leaves no photon behind, satisfying the constant need for clearer images, tha
|SOURCE Nikon Instruments, Inc.|
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