Santa Clara, CA (PRWEB) July 16, 2013
New instrumentation, tools and techniques will be featured on the Nanounity booth, #828, at this year’s annual M&M meeting being held in Indianapolis, August 4-8, 2013.
The Pemtron SEMART™ PS-250 scanning electron microscope (SEM) will be making its Nanounity US debut. This compact SEM provides users with quick and easy operation offering high performance at a reasonable price, a level that a user might expect to pay at least twice to own. With the power of the PS-230 SEM, the PS-250 allows users to work with larger samples up to 140 mm while retaining 3 nm spatial resolution. Users may add optional EBSD (Electron Back Scattered Detector) and EDS (Energy Dispersive Spectrometer) for more comprehensive analytical performance.
Nanounity will unveil the Delmic SECOM platform for correlative microscopy. This combines functional information from fluorescence microscopy with structural information from the SEM. The SECOM platform integrates a fluorescence microscope with a scanning electron microscope. This combination makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation fully automated. Delmic will give a tutorial on SECOM at 5.45pm on Tuesday 6th August at the Nanounity booth.
Nanounity specializes in the supply of complementary in situ techniques for the electron microscopist. Among the other techniques to be shown at this year’s M&M will be optical profilers and nanomechanical testing systems that incorporate nano-hardness testing with surface topography.
The 2013 M&M event will open its doors on August 4th for five days of papers, posters and exhibitions at the Indianapolis Convention
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