The world's first all-diamond probes for Atomic Force Microscopy (AFM) are now available from Nanoscience Instruments. NaDiaProbes®, made by Advanced Diamond Technologies, feature integrated all-diamond cantilevers and tips for unrivaled performance.
Phoenix, AZ (PRWEB) October 22, 2008 -- Nanoscience Instruments, the premier US-based distributor of nanotechnology instrumentation and supplies, today announces the worldwide distribution of NaDiaProbes® -- Advanced Diamond Technologies' (ADT) new line of all-diamond atomic force microscopy (AFM) probes.
NaDiaProbes are the only available AFM probes constructed entirely of diamond. They differ greatly from diamond-coated silicon or silicon nitride probes in that both the cantilever and tip are 100 percent UNCD®, a thin-film form of nanocrystalline diamond manufactured exclusively by ADT. NaDiaProbes benefit from the unsurpassed hardness of diamond, and they will outlast standard silicon probes by more than 100 times when imaging hard surfaces without sacrificing tip sharpness. NaDiaProbes also provide enhanced imaging performance on soft, sticky samples because of the low adhesion and low surface energy of diamond. They are suited for a wide variety of standard imaging applications as well as for applications in nanoscale metrology, inspection, and manufacturing.
Nanoscience Instruments is excited about supplying these unique AFM probes to the growing nanoscience research community. "NaDiaProbes have clear advantages for many applications, especially where tip durability is concerned. They will be instrumental in solving current and future challenges in nanotechnology R&D," said Mark Flowers, co-founder.
"We developed NaDiaProbes not only to make supe
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