The world's first metallic needle AFM probes are now available from Nanoscience Instruments. Featuring a unique combination of high aspect, consistent geometry, and high conductivity, metallic needle probes are enabling new applications in nanoscale sensing and manipulation.
Phoenix, AZ (PRWEB) March 24, 2009 -- Nanoscience Instruments, a premier distributor of nanotechnology instrumentation and supplies, today announced the worldwide distribution of NaugaNeedles' new line of metallic atomic force microscopy (AFM) probes.
NaugaNeedles' probes are the first commercial metallic needle AFM tips. The needle is fabricated of Ag2Ga, and can be produced in varying lengths, diameters, and attachment angles. A combination of high aspect, consistent geometry, and high conductivity enables a wide range of new applications not previously possible.
The tips have many advantages over metal coated tips, particularly wear. As a metal coated silicon tip wears, it becomes unusable in a short period of time. As a metallic needle wears, both conductivity and imaging quality remain constant over a very long time. Additionally, the needle probes are very high aspect, providing greater sensitivity for EFM measurements.
Needle AFM tips are available in standard lengths of 1, 5, or 10 µm with a diameter of 50 nm. Customized needle tips up to 100 µm long and 500 nm in diameter can be provided. The standard angle of attachment is 12 degrees but can also be customized to virtually any angle.
NaugaNeedles has produced an innovative product for a wide variety of uses. The simple geometry and high conductivity of the Needle probes provides a wide range of enhanced sensing and manipulation capabilities. Needle probes can also be extensively modified in many ways to further extend their applications per customer's request.
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