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Micro and Nano Scale Characterization of Fibers
Date:5/14/2008

Fibres present massive challenges and opportunities for micro and nano technologies. These challenges are not in the manufacturing of the fibres but in the control and understanding of their behaviour.

This one-day workshop will focus on the many challenges of fibre analysis at the micro and nano-scale using state-of-the art surface chemical analysis, including SIMS, XPS and SPM techniques.

Topics include fundamental effects of topography in SIMS and XPS, AFM nanomechanics, frictional force microscopy,multivariate analysis and important applications in industry.

This workshop will bring together leading researchers and practical analysts from industry and academia for discussions on the latest developments. Recommendations and guidance for reliable and robust measurements will be presented. The workshop is being held in conjunction with UK Surface Analysis Forum(www.uksaf.org), which will be held at the same venue on the preceding day (Wednesday 2nd July).

Confirmed speakers and topics include:

  • Professor Chris Carr, University of Manchester, UK
    Using surface analysis to characterise technical textiles

  • Professor George Stylios, Heriot Watt University, UK
    Nanofabrication of fi bres and fabrics for technical textiles: the challenges in measurement and characterisation

  • Professor Graham Leggett, University of Sheffield, UK
    Frictional force microscopy and the nano-analysis of fibres

  • Chris Byrne, Mediatex Ltd, UK
    Technical textiles: state of art, measurement issues, and future applications

  • Dr Ian Fletcher, Intertek MSG, UK
    Analysing real-life fi bre samples

  • Dr Jane McCann, University of Wales, UK
    Smart clothes and wearable technology

  • Chris Boardman, Unilever, UK
    How surface analysis can help in designing new laundry products

  • Dr Nawel Baghdali, LOreal Recherche, France
    Analysing hair and skin products using AFM

  • Plenary Speaker
    Dr Steve Pachuta, 3M Corporate Research Analytical Laboratory,St Paul, USA
    Computer-Assisted Interpretation of TOF-SIMS Data: Fun With Raw Files

Steves talk is scheduled for late afternoon on Wednesday 2 July

A conference dinner will be held on the evening of the 2nd July.


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Contact: Louise Dean
louise.dean@npl.co.uk
44-208-943-8772
National Physical Laboratory
Source:Eurekalert

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