"We abandon the idea of purity collecting precisely what we need," Bouman said. "Instead, let's take all the measurements we possibly can and then later extract what we want. This increases the envelope of what you can do enormously."
Purdue, the University of Notre Dame and GE Healthcare used MBIR to create Veo, a new CT scanning technology that enables physicians to diagnose patients with high-clarity images at previously unattainable low radiation dose levels. The technology has been shown to reduce radiation exposure by 78 percent.
"If you can get diagnostically usable scans at such low dosages this opens up the potential to do large-scale screening for things like lung cancer," Bouman said. "You open up entirely new clinical applications because the dosage is so low."
A CT scanner is far better at diagnosing disease than planar X-rays because it provides a three-dimensional picture of the tissue. However, conventional CT scanners emit too much radiation to merit wider diagnostic use.
"But as the dosage goes down, the risk-benefit tradeoff for screening will become much more favorable," Bouman said. "For electron microscopy, the principle advantage is higher resolutions, but there is also some advantage in reduction of electron dosage, which can damage the sample."
The research to develop Veo has been a team effort with Ken Sauer, an associate professor of electrical engineering at Notre Dame, in collaboration with Jean-Baptiste Thibault, Jiang Hsieh and Zhou Yu. Thibault and Yu worked on the technology as graduate assistants under Bouman and Sauer and both currently work for GE Healthcare.
"And, there are lots of other people doing similar and related research at other
|Contact: Emil Venere|